Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6828566 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2004-12-07 |
| 6794663 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2004-09-21 |
| 6781125 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Hiroyasu Shichi +2 more | 2004-08-24 |
| 6774363 | Method of preventing charging, and apparatus for charged particle beam using the same | Muneyuki Fukuda, Hiroyasu Shichi | 2004-08-10 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Tohru Ishitani, Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura +1 more | 2004-05-11 |