Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6780660 | System for testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2004-08-24 |
| 6770496 | Method of testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2004-08-03 |
| 6771077 | Method of testing electronic devices indicating short-circuit | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto | 2004-08-03 |