MC

Michael A. Carcasi

TL Tokyo Electron Limited: 43 patents #65 of 5,567Top 2%
OU Osaka University: 1 patents #681 of 1,984Top 35%
🗺 Texas: #2,210 of 125,132 inventorsTop 2%
Overall (All Time): #69,011 of 4,157,543Top 2%
43
Patents All Time

Issued Patents All Time

Showing 1–25 of 43 patents

Patent #TitleCo-InventorsDate
12424467 Systems and methods for determining a localized fluid velocity on a spinning substrate by tracking movement of a tracer across the spinning substrate Sean Berglund, Ankur Agarwal, Steven Gueci 2025-09-23
12226796 Bath systems and methods thereof Ihsan Simms, Joel Estrella, Antonio Luis Pacheco Rotondaro, Joshua Hooge, Hiroshi Marumoto 2025-02-18
12165870 Chemical amplification methods and techniques for developable bottom anti-reflective coatings and dyed implant resists Steven Scheer, Benjamen M. Rathsack, Mark H. Somervell, Joshua Hooge 2024-12-10
12123778 Thermal imaging sensor for integration into track system Kazuhiro Shiba, Masahide Tadokoro, Masashi Enomoto, Toyohisa Tsuruda 2024-10-22
11998945 Methods and systems to monitor, control, and synchronize dispense systems Joshua Hooge, Mark H. Somervell 2024-06-04
11738363 Bath systems and methods thereof Ihsan Simms, Joel Estrella, Antonio Luis Pacheco Rotondaro, Joshua Hooge, Hiroshi Marumoto 2023-08-29
11703459 System and method to calibrate a plurality of wafer inspection system (WIS) modules Hiroyuki Iwaki, Toyohisa Tsuruda, Masahide Tadokoro 2023-07-18
11637031 Systems and methods for spin process video analysis during substrate processing Joshua Hooge, Mark H. Somervell, Hiroyuki Iwaki, Masahide Tadokoro, Masashi Enomoto +2 more 2023-04-25
11624607 Hardware improvements and methods for the analysis of a spinning reflective substrates Joshua Hooge 2023-04-11
11474028 Systems and methods for monitoring one or more characteristics of a substrate Mark H. Somervell, Joshua Hooge, Masahide Tadokoro 2022-10-18
11339733 Systems and methods to monitor particulate accumulation for bake chamber cleaning Mark H. Somervell 2022-05-24
11276157 Systems and methods for automated video analysis detection techniques for substrate process Joel Estrella, Joshua Hooge 2022-03-15
11262657 System and method of planarization control using a cross-linkable material Ryan L. Burns, Mark H. Somervell 2022-03-01
11168978 Hardware improvements and methods for the analysis of a spinning reflective substrates Joshua Hooge 2021-11-09
11163236 Method and process for stochastic driven detectivity healing Seiji Nagahara, Congque DINH, Mark H. Somervell 2021-11-02
11061332 Methods for sensitizing photoresist using flood exposures Mark H. Somervell, Seiji Nagahara 2021-07-13
10809620 Systems and methods for developer drain line monitoring Mark H. Somervell, Joshua Hooge 2020-10-20
10551743 Critical dimension control by use of photo-sensitized chemicals or photo-sensitized chemically amplified resist Anton J. deVilliers 2020-02-04
10534266 Methods and techniques to use with photosensitized chemically amplified resist chemicals and processes Joshua Hooge, Benjamen M. Rathsack, Seiji Nagahara 2020-01-14
10522428 Critical dimension control by use of a photo agent Anton J. deVilliers 2019-12-31
10429745 Photo-sensitized chemically amplified resist (PS-CAR) simulation Benjamen M. Rathsack, Mark H. Somervell, Wallace P. Printz, Seiji Nagahara, Seiichi Tagawa 2019-10-01
10096528 Critical dimension control by use of a photo agent Anton J. deVilliers 2018-10-09
10048594 Photo-sensitized chemically amplified resist (PS-CAR) model calibration Mark H. Somervell, Carlos A. Fonseca 2018-08-14
10048587 Method and apparatus for increased recirculation and filtration in a photoresist dispense system using a liquid empty reservoir Wallace P. Printz, Joshua Hooge 2018-08-14
10020195 Chemical amplification methods and techniques for developable bottom anti-reflective coatings and dyed implant resists Steven Scheer, Benjamen M. Rathsack, Mark H. Somervell, Joshua Hooge 2018-07-10