MS

Mark H. Somervell

TL Tokyo Electron Limited: 47 patents #58 of 5,567Top 2%
TI Texas Instruments: 8 patents #1,843 of 12,488Top 15%
OU Osaka University: 1 patents #681 of 1,984Top 35%
🗺 Texas: #1,435 of 125,132 inventorsTop 2%
Overall (All Time): #45,764 of 4,157,543Top 2%
55
Patents All Time

Issued Patents All Time

Showing 1–25 of 55 patents

Patent #TitleCo-InventorsDate
12165870 Chemical amplification methods and techniques for developable bottom anti-reflective coatings and dyed implant resists Steven Scheer, Michael A. Carcasi, Benjamen M. Rathsack, Joshua Hooge 2024-12-10
11998945 Methods and systems to monitor, control, and synchronize dispense systems Joshua Hooge, Michael A. Carcasi 2024-06-04
11637031 Systems and methods for spin process video analysis during substrate processing Michael A. Carcasi, Joshua Hooge, Hiroyuki Iwaki, Masahide Tadokoro, Masashi Enomoto +2 more 2023-04-25
11538684 UV-assisted stripping of hardened photoresist to create chemical templates for directed self-assembly Ian J. Brown, Ihsan Simms, Ainhoa Romo Negreira, Kathleen Nafus 2022-12-27
11474028 Systems and methods for monitoring one or more characteristics of a substrate Michael A. Carcasi, Joshua Hooge, Masahide Tadokoro 2022-10-18
11456185 Planarization of semiconductor devices Ryan L. Burns, Corey Lemley 2022-09-27
11455436 Predicting across wafer spin-on planarization over a patterned topography Ryan L. Burns 2022-09-27
11339733 Systems and methods to monitor particulate accumulation for bake chamber cleaning Michael A. Carcasi 2022-05-24
11262657 System and method of planarization control using a cross-linkable material Michael A. Carcasi, Ryan L. Burns 2022-03-01
11163236 Method and process for stochastic driven detectivity healing Michael A. Carcasi, Seiji Nagahara, Congque DINH 2021-11-02
11061332 Methods for sensitizing photoresist using flood exposures Michael A. Carcasi, Seiji Nagahara 2021-07-13
10809620 Systems and methods for developer drain line monitoring Michael A. Carcasi, Joshua Hooge 2020-10-20
10622267 Facilitation of spin-coat planarization over feature topography during substrate fabrication Ryan L. Burns, Benjamen M. Rathsack, Makoto Muramatsu 2020-04-14
10490402 UV-assisted stripping of hardened photoresist to create chemical templates for directed self-assembly Ian J. Brown, Ihsan Simms, Ainhoa Romo Negreira, Kathleen Nafus 2019-11-26
10429745 Photo-sensitized chemically amplified resist (PS-CAR) simulation Michael A. Carcasi, Benjamen M. Rathsack, Wallace P. Printz, Seiji Nagahara, Seiichi Tagawa 2019-10-01
10170354 Subtractive methods for creating dielectric isolation structures within open features Benjamen M. Rathsack 2019-01-01
10048594 Photo-sensitized chemically amplified resist (PS-CAR) model calibration Michael A. Carcasi, Carlos A. Fonseca 2018-08-14
10020195 Chemical amplification methods and techniques for developable bottom anti-reflective coatings and dyed implant resists Steven Scheer, Michael A. Carcasi, Benjamen M. Rathsack, Joshua Hooge 2018-07-10
9978618 Hot plate with programmable array of lift devices for multi-bake process optimization Josh Hooge, Michael A. Carcasi 2018-05-22
9793137 Use of grapho-epitaxial directed self-assembly applications to precisely cut logic lines Benjamen M. Rathsack 2017-10-17
9746774 Mitigation of EUV shot noise replicating into acid shot noise in photo-sensitized chemically-amplified resist (PS-CAR) Michael A. Carcasi 2017-08-29
9715172 Use of topography to direct assembly of block copolymers in grapho-epitaxial applications Benjamen M. Rathsack 2017-07-25
9633847 Using sub-resolution openings to aid in image reversal, directed self-assembly, and selective deposition Benjamen M. Rathsack 2017-04-25
9613801 Integration of absorption based heating bake methods into a photolithography track system Michael A. Carcasi, Benjamen M. Rathsack 2017-04-04
9519227 Metrology for measurement of photosensitizer concentration within photo-sensitized chemically-amplified resist (PS-CAR) Michael A. Carcasi, Joshua Hooge, Benjamen M. Rathsack, Seiji Nagahara 2016-12-13