Daniel Prager — 21 Patents at Tokyo Electron Limited

Daniel Prager has been granted 21 US patents while listed as an inventor at Tokyo Electron Limited. The first was granted in 2006 and the most recent in September 2013. Daniel Prager ranks #201,324 of 4,157,543 US inventors in our database (top 4.8%). Patent records list Daniel Prager in Hopewell Junction, NY, US.

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8532796	Contact processing using multi-input/multi-output (MIMO) models	Merritt Funk, Peter Biolsi, Ryukichi Shimizu	2013-09-10
8501628	Differential metal gate etching process	Vinh Luong, Hiroyuki Takahashi, Akiteru Ko, Asao Yamashita, Vaidya Bharadwaj +1 more	2013-08-06
8183062	Creating metal gate structures using Lithography-Etch-Lithography-Etch (LELE) processing sequences	Merritt Funk, Radha Sundararajan, Asao Yamashita	2012-05-22
8019458	Creating multi-layer/multi-input/multi-output (MLMIMO) models for metal-gate structures	Merritt Funk, Radha Sundararajan, Asao Yamashita, Hyung Joo Lee	2011-09-13
7967995	Multi-layer/multi-input/multi-output (MLMIMO) models and method for using	Merritt Funk, Radha Sundararajan, Hyung Joo Lee, Asao Yamashita	2011-06-28
7939450	Method and apparatus for spacer-optimization (S-O)	Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundararajan	2011-05-10
7899637	Method and apparatus for creating a gate optimization evaluation library	Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundararajan	2011-03-01
7894927	Using Multi-Layer/Multi-Input/Multi-Output (MLMIMO) models for metal-gate structures	Merritt Funk, Radha Sundararajan, Asao Yamashita, Hyung Joo Lee	2011-02-22
7765077	Method and apparatus for creating a Spacer-Optimization (S-O) library	Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundaranajan	2010-07-27
7713758	Method and apparatus for optimizing a gate channel	Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundararajan	2010-05-11
7567700	Dynamic metrology sampling with wafer uniformity control	Merritt Funk, Radha Sundararajan, Wesley C. Natzle	2009-07-28	$11,761,000
7542859	Creating a virtual profile library	Merritt Funk	2009-06-02
7502660	Feature dimension deviation correction system, method and program product	David V. Horak, Wesley C. Natzle, Merritt Funk, Kevin Lally	2009-03-10	$6,331,000
7502709	Dynamic metrology sampling for a dual damascene process	Merritt Funk, Radha Sundararajan, Wesley C. Natzle	2009-03-10	$6,331,000
7487053	Refining a virtual profile library	Merritt Funk	2009-02-03
7395132	Optical metrology model optimization for process control	Jason Ferns, Lawrence Lane, Dan Engelhard	2008-07-01
7328418	Iso/nested control for soft mask processing	Asao Yamashita, Merritt Funk	2008-02-05
7305322	Using a virtual profile library	Merritt Funk	2007-12-04
7289864	Feature dimension deviation correction system, method and program product	David V. Horak, Wesley C. Natzle, Merritt Funk, Kevin Lally	2007-10-30	$4,304,000
7209798	Iso/nested cascading trim control with model feedback updates	Asao Yamashita, Merritt Funk	2007-04-24
7126700	Parametric optimization of optical metrology model	Junwei Bao, Vi Vuong, Manuel Madriaga	2006-10-24

Daniel Prager — 21 Patents

Issued Patents All Time

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