DP

Daniel Prager

TL Tokyo Electron Limited: 19 patents #307 of 5,567Top 6%
IBM: 4 patents #21,733 of 70,183Top 35%
TT Timbre Technologies: 2 patents #13 of 39Top 35%
Overall (All Time): #210,560 of 4,157,543Top 6%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8532796 Contact processing using multi-input/multi-output (MIMO) models Merritt Funk, Peter Biolsi, Ryukichi Shimizu 2013-09-10
8501628 Differential metal gate etching process Vinh Luong, Hiroyuki Takahashi, Akiteru Ko, Asao Yamashita, Vaidya Bharadwaj +1 more 2013-08-06
8183062 Creating metal gate structures using Lithography-Etch-Lithography-Etch (LELE) processing sequences Merritt Funk, Radha Sundararajan, Asao Yamashita 2012-05-22
8019458 Creating multi-layer/multi-input/multi-output (MLMIMO) models for metal-gate structures Merritt Funk, Radha Sundararajan, Asao Yamashita, Hyung Joo Lee 2011-09-13
7967995 Multi-layer/multi-input/multi-output (MLMIMO) models and method for using Merritt Funk, Radha Sundararajan, Hyung Joo Lee, Asao Yamashita 2011-06-28
7939450 Method and apparatus for spacer-optimization (S-O) Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundararajan 2011-05-10
7899637 Method and apparatus for creating a gate optimization evaluation library Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundararajan 2011-03-01
7894927 Using Multi-Layer/Multi-Input/Multi-Output (MLMIMO) models for metal-gate structures Merritt Funk, Radha Sundararajan, Asao Yamashita, Hyung Joo Lee 2011-02-22
7765077 Method and apparatus for creating a Spacer-Optimization (S-O) library Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundaranajan 2010-07-27
7713758 Method and apparatus for optimizing a gate channel Asao Yamashita, Merritt Funk, Lee Chen, Radha Sundararajan 2010-05-11
7567700 Dynamic metrology sampling with wafer uniformity control Merritt Funk, Radha Sundararajan, Wesley C. Natzle 2009-07-28
7542859 Creating a virtual profile library Merritt Funk 2009-06-02
7502660 Feature dimension deviation correction system, method and program product David V. Horak, Wesley C. Natzle, Merritt Funk, Kevin Lally 2009-03-10
7502709 Dynamic metrology sampling for a dual damascene process Merritt Funk, Radha Sundararajan, Wesley C. Natzle 2009-03-10
7487053 Refining a virtual profile library Merritt Funk 2009-02-03
7395132 Optical metrology model optimization for process control Jason Ferns, Lawrence Lane, Dan Engelhard 2008-07-01
7328418 Iso/nested control for soft mask processing Asao Yamashita, Merritt Funk 2008-02-05
7305322 Using a virtual profile library Merritt Funk 2007-12-04
7289864 Feature dimension deviation correction system, method and program product David V. Horak, Wesley C. Natzle, Merritt Funk, Kevin Lally 2007-10-30
7209798 Iso/nested cascading trim control with model feedback updates Asao Yamashita, Merritt Funk 2007-04-24
7126700 Parametric optimization of optical metrology model Junwei Bao, Vi Vuong, Manuel Madriaga 2006-10-24