Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11150296 | Method and apparatus for testing a semiconductor device | Szu-Chia Huang, Jhih Jie Shao, Tang-Hsuan Chung | 2021-10-19 |
| 10520545 | Method and apparatus for testing a semiconductor device | Szu-Chia Huang, Jhih Jie Shao, Tang-Hsuan Chung | 2019-12-31 |
| 9995770 | Multidirectional semiconductor arrangement testing | Tseng Chin Lo, Kuo-Chuan Chang, Yuan-Yao Chang, Chien-Chang Lee | 2018-06-12 |
| 9639647 | Method of making semiconductor device and system for performing the same | Chung-Min Fu, Wan-Yu Lo, Chin-Chou Liu | 2017-05-02 |
| 9459316 | Method and apparatus for testing a semiconductor device | Szu-Chia Huang, Jhih Jie Shao, Tang-Hsuan Chung | 2016-10-04 |
| 9151798 | Method and apparatus for testing a semiconductor device | Jhih Jie Shao, Tang-Hsuan Chung, Szu-Chia Huang, Chien-Chang Lee, Yu-Lan Hsiao | 2015-10-06 |
| 9075101 | Method and apparatus for testing a semiconductor device | Jhih Jie Shao, Szu-Chia Huang, Tang-Hsuan Chung | 2015-07-07 |
| 8978003 | Method of making semiconductor device and a control system for performing the same | Chung-Min Fu, Wan-Yu Lo, Chin-Chou Liu | 2015-03-10 |
| 8674355 | Integrated circuit test units with integrated physical and electrical test regions | Heng-Hsin Liu, Shu-Cheng Kuo, Chien-Chang Lee, Chun-Hung Lin | 2014-03-18 |
| 8531201 | Method and apparatus for testing a semiconductor device | Jhih Jie Shao, Szu-Chia Huang, Tang-Hsuan Chung | 2013-09-10 |
| 8499274 | Computer implemented system and method for leakage calculation | Chien-Ju Chao, Jerry Chang Jui Kao, King-Ho Tam, Chung-Hsing Wang | 2013-07-30 |
| 7545045 | Dummy via for reducing proximity effect and method of using the same | Kun Huang, Jhy-Chen You, Kuan-Miao Liu, Tsong-Yuan Chen, Chih-Yang Wang +2 more | 2009-06-09 |
| 7160811 | Laminated silicate glass layer etch stop method for fabricating microelectronic product | Yen-Ming Chen, Yu-Hua Lee, Dian-Hau Chen, Chia-Hung Lai, Kang-Min Kuo | 2007-01-09 |
| 7015129 | Bond pad scheme for Cu process | Chia-Hung Lai, Jiunn-Jyi Lin, Tzong-Sheng Chang, Min Cao, Yu-Hua Lee +1 more | 2006-03-21 |
| 6943062 | Contaminant particle removal by optical tweezers | Hong-Miao Chen, Yu-Chang Jong | 2005-09-13 |
| 6844626 | Bond pad scheme for Cu process | Chia-Hung Lai, Jiunn-Jyi Lin, Tzong-Sheng Chang, Min Cao, Yu-Hua Lee +1 more | 2005-01-18 |
| 5990567 | System for in-line monitoring of photo processing tilt in VLSI fabrication | Chia-Hsiang Chen, Han-Liang Tseng | 1999-11-23 |
| 5949547 | System for in-line monitoring of photo processing in VLSI fabrication | Chia-Hsiang Chen, Han-Liang Tseng | 1999-09-07 |
| 5685947 | Chemical-mechanical polishing with an embedded abrasive | Ying-Chen Chao | 1997-11-11 |