Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9995770 | Multidirectional semiconductor arrangement testing | Tseng Chin Lo, Huan Chi Tseng, Yuan-Yao Chang, Chien-Chang Lee | 2018-06-12 |
| 6480019 | Multiple voted logic cell testable by a scan chain and system and method of testing the same | Arthur Howard Waldie, Robert Ward James | 2002-11-12 |