Jacek Lagowski — 26 Patents at Semiconductor Diagnostics

Jacek Lagowski has been granted 26 US patents while listed as an inventor at Semiconductor Diagnostics. The first was granted in 1984 and the most recent in November 2024. Jacek Lagowski ranks #150,017 of 4,157,543 US inventors in our database (top 3.6%). Patent records list Jacek Lagowski in Woburn, MA, US.

Issued Patents All Time

Showing 1–25 of 26 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12154833	Semiconductor doping characterization method using photoneutralization time constant of corona surface charge	Marshall D. Wilson, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk	2024-11-26
12027430	Semiconductor doping characterization method using photoneutralization time constant of corona surface charge	Marshall D. Wilson, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk	2024-07-02
11561254	Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates	Marshall D. Wilson, Bret Schrayer, Alexandre Savtchouk, Dmitriy Marinskiy	2023-01-24
10969370	Measuring semiconductor doping using constant surface potential corona charging	Marshall D. Wilson, Alexandre Savtchouk, Carlos Almeida, Csaba Buday	2021-04-06
10763179	Non-contact method to monitor and quantify effective work function of metals	Dmitriy Marinskiy, Thye Chong Loy, Sung-Li Wang, Lin-Jung Wu, Shyh-Shin Ferng +2 more	2020-09-01
9685906	Photoluminescence mapping of passivation defects for silicon photovoltaics	Marshall D. Wilson, Ferenc Korsos, Gyorgy Nadudvari	2017-06-20
8912799	Accurate measurement of excess carrier lifetime using carrier decay method	Marshall D. Wilson	2014-12-16
8093920	Accurate measuring of long steady state minority carrier diffusion lengths	Alexandre Savtchouk, Marshall D. Wilson	2012-01-10
7202691	Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers	Piotr Edelman, Dmitriy Marinskiy, Joseph Nicholas Kochey, Carlos Almeida	2007-04-10
6815974	Determining composition of mixed dielectrics	Marshall D. Wilson, John F. D'Amico, Alexandre Savtchouk, Lubomir L. Jastrzebski	2004-11-09
6771091	Method and system for elevated temperature measurement with probes designed for room temperature measurement	Piotr Edelman, Frank Gossett, Nick Kochey, Alexandre Savtchouk	2004-08-03
6680621	Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current	Alexander Savtchouk, John F. D'Amico, Marshall D. Wilson, Lubomir L. Jastrzebski	2004-01-20
6597193	Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current	Alexander Savtchouk, Marshall D. Wilson	2003-07-22
6538462	Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge	Marshall D. Wilson, Alexander Savtchouk	2003-03-25
6512384	Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages	Vladimir N. Faifer, Andrei Aleinikov	2003-01-28
6114865	Device for electrically contacting a floating semiconductor wafer having an insulating film	Alexander Savtchouk, Nick Kochev, Charles Schraver	2000-09-05
6037797	Measurement of the interface trap charge in an oxide semiconductor layer interface	Piotr Edelman, Marshall D. Wilson	2000-03-14
5977788	Elevated temperature measurement of the minority carrier lifetime in the depletion layer of a semiconductor wafer	—	1999-11-02
5773989	Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer	Piotr Edelman, Andrew M. Hoff, Lubek Jastrzebski	1998-06-30
5663657	Determining long minority carrier diffusion lengths	Lubek Jastrzebski, Andrzej Kontkiewicz, Piotr Edelman	1997-09-02
5369495	Semiconductor contaminant sensing system and method	—	1994-11-29
5177351	Method and apparatus for determining the minority carrier diffusion length from linear constant photon flux photovoltage measurements	—	1993-01-05
5025145	Method and apparatus for determining the minority carrier diffusion length from linear constant photon flux photovoltage measurements	—	1991-06-18
4642565	Method to determine the crystalline properties of an interface of two materials by photovoltage phenomenon	Lubomir L. Jastrzebski	1987-02-10
4498772	Method to determine the crystalline properties of an interface of two materials by an optical technique	Lubomir L. Jastrzebski	1985-02-12	$2,020,000

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Jacek Lagowski — 26 Patents

Issued Patents All Time

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