Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7202691 | Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers | Jacek Lagowski, Piotr Edelman, Dmitriy Marinskiy, Carlos Almeida | 2007-04-10 |