Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7202691 | Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers | Jacek Lagowski, Dmitriy Marinskiy, Joseph Nicholas Kochey, Carlos Almeida | 2007-04-10 |
| 6771091 | Method and system for elevated temperature measurement with probes designed for room temperature measurement | Jacek Lagowski, Frank Gossett, Nick Kochey, Alexandre Savtchouk | 2004-08-03 |
| 6037797 | Measurement of the interface trap charge in an oxide semiconductor layer interface | Jacek Lagowski, Marshall D. Wilson | 2000-03-14 |
| 5773989 | Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer | Andrew M. Hoff, Lubek Jastrzebski, Jacek Lagowski | 1998-06-30 |
| 5663657 | Determining long minority carrier diffusion lengths | Jacek Lagowski, Lubek Jastrzebski, Andrzej Kontkiewicz | 1997-09-02 |