| 12154833 |
Semiconductor doping characterization method using photoneutralization time constant of corona surface charge |
Jacek Lagowski, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk |
2024-11-26 |
| 12027430 |
Semiconductor doping characterization method using photoneutralization time constant of corona surface charge |
Jacek Lagowski, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk |
2024-07-02 |
| 11561254 |
Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates |
Bret Schrayer, Alexandre Savtchouk, Dmitriy Marinskiy, Jacek Lagowski |
2023-01-24 |
| 10969370 |
Measuring semiconductor doping using constant surface potential corona charging |
Jacek Lagowski, Alexandre Savtchouk, Carlos Almeida, Csaba Buday |
2021-04-06 |
| 9685906 |
Photoluminescence mapping of passivation defects for silicon photovoltaics |
Jacek Lagowski, Ferenc Korsos, Gyorgy Nadudvari |
2017-06-20 |
| 8912799 |
Accurate measurement of excess carrier lifetime using carrier decay method |
Jacek Lagowski |
2014-12-16 |
| 8093920 |
Accurate measuring of long steady state minority carrier diffusion lengths |
Jacek Lagowski, Alexandre Savtchouk |
2012-01-10 |
| 7188513 |
Detecting concealed security threats |
— |
2007-03-13 |
| 7100424 |
Apparatus for accessing container security threats and method of use |
— |
2006-09-05 |
| 6815974 |
Determining composition of mixed dielectrics |
Jacek Lagowski, John F. D'Amico, Alexandre Savtchouk, Lubomir L. Jastrzebski |
2004-11-09 |
| 6680621 |
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
Alexander Savtchouk, Jacek Lagowski, John F. D'Amico, Lubomir L. Jastrzebski |
2004-01-20 |
| 6597193 |
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
Jacek Lagowski, Alexander Savtchouk |
2003-07-22 |
| 6569691 |
Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer |
Lubomir L. Jastrzebski, Alexander Savtchouk |
2003-05-27 |
| 6538462 |
Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge |
Jacek Lagowski, Alexander Savtchouk |
2003-03-25 |
| 6037797 |
Measurement of the interface trap charge in an oxide semiconductor layer interface |
Jacek Lagowski, Piotr Edelman |
2000-03-14 |