Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12154833 | Semiconductor doping characterization method using photoneutralization time constant of corona surface charge | Jacek Lagowski, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk | 2024-11-26 |
| 12027430 | Semiconductor doping characterization method using photoneutralization time constant of corona surface charge | Jacek Lagowski, Carlos Almeida, Bret Schrayer, Alexandre Savtchouk | 2024-07-02 |
| 11561254 | Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates | Bret Schrayer, Alexandre Savtchouk, Dmitriy Marinskiy, Jacek Lagowski | 2023-01-24 |
| 10969370 | Measuring semiconductor doping using constant surface potential corona charging | Jacek Lagowski, Alexandre Savtchouk, Carlos Almeida, Csaba Buday | 2021-04-06 |
| 9685906 | Photoluminescence mapping of passivation defects for silicon photovoltaics | Jacek Lagowski, Ferenc Korsos, Gyorgy Nadudvari | 2017-06-20 |
| 8912799 | Accurate measurement of excess carrier lifetime using carrier decay method | Jacek Lagowski | 2014-12-16 |
| 8093920 | Accurate measuring of long steady state minority carrier diffusion lengths | Jacek Lagowski, Alexandre Savtchouk | 2012-01-10 |
| 7188513 | Detecting concealed security threats | — | 2007-03-13 |
| 7100424 | Apparatus for accessing container security threats and method of use | — | 2006-09-05 |
| 6815974 | Determining composition of mixed dielectrics | Jacek Lagowski, John F. D'Amico, Alexandre Savtchouk, Lubomir L. Jastrzebski | 2004-11-09 |
| 6680621 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Alexander Savtchouk, Jacek Lagowski, John F. D'Amico, Lubomir L. Jastrzebski | 2004-01-20 |
| 6597193 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Jacek Lagowski, Alexander Savtchouk | 2003-07-22 |
| 6569691 | Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer | Lubomir L. Jastrzebski, Alexander Savtchouk | 2003-05-27 |
| 6538462 | Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge | Jacek Lagowski, Alexander Savtchouk | 2003-03-25 |
| 6037797 | Measurement of the interface trap charge in an oxide semiconductor layer interface | Jacek Lagowski, Piotr Edelman | 2000-03-14 |