Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Accurate measuring of long steady state minority carrier diffusion lengths

Accurate measuring of long steady state minority carrier diffusion lengths

US Patent 8093920 · Granted Jan 10, 2012

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor doping characterization method using photoneutralization time cons2024
Semiconductor doping characterization method using photoneutralization time cons2024
Semiconductor doping characterization method using photoneutralization time cons2024
Semiconductor doping characterization method using photoneutralization time cons2024
Semiconductor doping characterization method using photoneutralization time cons2024
Semiconductor doping characterization method using photoneutralization time cons2024
Topside contact device and method for characterization of high electron mobility2023
Topside contact device and method for characterization of high electron mobility2023
Topside contact device and method for characterization of high electron mobility2023
Measuring semiconductor doping using constant surface potential corona charging2021
Measuring semiconductor doping using constant surface potential corona charging2021
Measuring semiconductor doping using constant surface potential corona charging2021