Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12154833 | Semiconductor doping characterization method using photoneutralization time constant of corona surface charge | Marshall D. Wilson, Jacek Lagowski, Carlos Almeida, Bret Schrayer | 2024-11-26 |
| 12027430 | Semiconductor doping characterization method using photoneutralization time constant of corona surface charge | Marshall D. Wilson, Jacek Lagowski, Carlos Almeida, Bret Schrayer | 2024-07-02 |
| 11561254 | Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates | Marshall D. Wilson, Bret Schrayer, Dmitriy Marinskiy, Jacek Lagowski | 2023-01-24 |
| 10969370 | Measuring semiconductor doping using constant surface potential corona charging | Jacek Lagowski, Marshall D. Wilson, Carlos Almeida, Csaba Buday | 2021-04-06 |
| 8093920 | Accurate measuring of long steady state minority carrier diffusion lengths | Jacek Lagowski, Marshall D. Wilson | 2012-01-10 |
| 6815974 | Determining composition of mixed dielectrics | Jacek Lagowski, Marshall D. Wilson, John F. D'Amico, Lubomir L. Jastrzebski | 2004-11-09 |
| 6771091 | Method and system for elevated temperature measurement with probes designed for room temperature measurement | Jacek Lagowski, Piotr Edelman, Frank Gossett, Nick Kochey | 2004-08-03 |