Issued Patents All Time
Showing 1–25 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10883941 | Micro photoluminescence imaging | Zoltan Tamas Kiss, Laszlo Dudas, Zsolt Kovacs, Imre Lajtos, Gyorgy Nadudvari +1 more | 2021-01-05 |
| 10209190 | Micro photoluminescence imaging with optical filtering | Zoltan Tamas Kiss, Laszlo Dudas, Gyorgy Nadudvari, Nicolas Laurent | 2019-02-19 |
| 10018565 | Micro photoluminescence imaging with optical filtering | Zoltan Tamas Kiss, Laszlo Dudas, Gyorgy Nadudvari, Nicolas Laurent | 2018-07-10 |
| 10012593 | Micro photoluminescence imaging | Zoltan Tamas Kiss, Laszlo Dudas, Zsolt Kovacs, Imre Lajtos, Gyorgy Nadudvari +1 more | 2018-07-03 |
| 6815974 | Determining composition of mixed dielectrics | Jacek Lagowski, Marshall D. Wilson, John F. D'Amico, Alexandre Savtchouk | 2004-11-09 |
| 6680621 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Alexander Savtchouk, Jacek Lagowski, John F. D'Amico, Marshall D. Wilson | 2004-01-20 |
| 6569691 | Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer | Alexander Savtchouk, Marshall D. Wilson | 2003-05-27 |
| 4923826 | Method for forming dielectrically isolated transistor | Ronald J. Johansson, Donald J. Sauer | 1990-05-08 |
| 4891092 | Method for making a silicon-on-insulator substrate | — | 1990-01-02 |
| 4824698 | High temperature annealing to improve SIMOX characteristics | Gary W. Looney, David L. Patterson | 1989-04-25 |
| 4805187 | Determination of substrate temperature used during oxygen implantation of SIMOX wafer | Guenther Harbeke | 1989-02-14 |
| 4772568 | Method of making integrated circuit with pair of MOS field effect transistors sharing a common source/drain region | — | 1988-09-20 |
| 4766317 | Optical reflectance method of examining a SIMOX article | Guenther Harbeke | 1988-08-23 |
| 4751561 | Dielectrically isolated PMOS, NMOS, PNP and NPN transistors on a silicon wafer | — | 1988-06-14 |
| 4704186 | Recessed oxide method for making a silicon-on-insulator substrate | — | 1987-11-03 |
| 4698316 | Method of depositing uniformly thick selective epitaxial silicon | John F. Corboy, Jr., Robert H. Pagliaro, Jr., Ramazan Soydan | 1987-10-06 |
| 4685199 | Method for forming dielectrically isolated PMOS, NMOS, PNP and NPN transistors on a silicon wafer | — | 1987-08-11 |
| 4654681 | Arrangement of semiconductor devices on a wafer | — | 1987-03-31 |
| 4642565 | Method to determine the crystalline properties of an interface of two materials by photovoltage phenomenon | Jacek Lagowski | 1987-02-10 |
| 4619033 | Fabricating of a CMOS FET with reduced latchup susceptibility | — | 1986-10-28 |
| 4615762 | Method for thinning silicon | John F. Corboy, Jr., Robert H. Pagliaro, Jr., Ramazan Soydan | 1986-10-07 |
| 4592792 | Method for forming uniformly thick selective epitaxial silicon | John F. Corboy, Jr. | 1986-06-03 |
| 4586240 | Vertical IGFET with internal gate and method for making same | Scott C. Blackstone, John F. Corboy, Jr. | 1986-05-06 |
| 4578142 | Method for growing monocrystalline silicon through mask layer | John F. Corboy, Jr., Scott C. Blackstone, Robert H. Pagliaro, Jr. | 1986-03-25 |
| 4566025 | CMOS Structure incorporating vertical IGFETS | Alfred C. Ipri | 1986-01-21 |