Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4698316 | Method of depositing uniformly thick selective epitaxial silicon | Robert H. Pagliaro, Jr., Lubomir L. Jastrzebski, Ramazan Soydan | 1987-10-06 |
| 4615762 | Method for thinning silicon | Lubomir L. Jastrzebski, Robert H. Pagliaro, Jr., Ramazan Soydan | 1986-10-07 |
| 4592792 | Method for forming uniformly thick selective epitaxial silicon | Lubomir L. Jastrzebski | 1986-06-03 |
| 4586240 | Vertical IGFET with internal gate and method for making same | Scott C. Blackstone, Lubomir L. Jastrzebski | 1986-05-06 |
| 4578142 | Method for growing monocrystalline silicon through mask layer | Lubomir L. Jastrzebski, Scott C. Blackstone, Robert H. Pagliaro, Jr. | 1986-03-25 |
| 4557794 | Method for forming a void-free monocrystalline epitaxial layer on a mask | Joseph Thomas McGinn, Lubomir L. Jastrzebski | 1985-12-10 |
| 4549926 | Method for growing monocrystalline silicon on a mask layer | Lubomir L. Jastrzebski, Scott C. Blackstone, Robert H. Pagliaro, Jr. | 1985-10-29 |
| 4546375 | Vertical IGFET with internal gate and method for making same | Scott C. Blackstone, Lubomir L. Jastrzebski | 1985-10-08 |
| 4482422 | Method for growing a low defect monocrystalline layer on a mask | Joseph Thomas McGinn, Lubomir L. Jastrzebski | 1984-11-13 |
| 4386255 | Susceptor for rotary disc reactor | Samuel Berkman | 1983-05-31 |
| 4352017 | Apparatus for determining the quality of a semiconductor surface | Michael Duffy, Peter John Zanzucchi | 1982-09-28 |