Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6680621 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Jacek Lagowski, John F. D'Amico, Marshall D. Wilson, Lubomir L. Jastrzebski | 2004-01-20 |
| 6597193 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current | Jacek Lagowski, Marshall D. Wilson | 2003-07-22 |
| 6569691 | Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer | Lubomir L. Jastrzebski, Marshall D. Wilson | 2003-05-27 |
| 6538462 | Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge | Jacek Lagowski, Marshall D. Wilson | 2003-03-25 |
| 6114865 | Device for electrically contacting a floating semiconductor wafer having an insulating film | Jacek Lagowski, Nick Kochev, Charles Schraver | 2000-09-05 |