Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5773989 | Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer | Piotr Edelman, Andrew M. Hoff, Jacek Lagowski | 1998-06-30 |
| 5663657 | Determining long minority carrier diffusion lengths | Jacek Lagowski, Andrzej Kontkiewicz, Piotr Edelman | 1997-09-02 |