AA

Andrei Aleinikov

SD Semiconductor Diagnostics: 1 patents #10 of 19Top 55%
Overall (All Time): #3,501,069 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6512384 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages Jacek Lagowski, Vladimir N. Faifer 2003-01-28