Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442090 | Systems and methods for measuring electrical characteristics of a material using a non-destructive multi-point probe | Jan Moritz Limpinsel, Octavi Santiago Escala Semonin, Edwin J. Rodriguez, Brendan M. Kayes | 2022-09-13 |
| 9921261 | Method and apparatus for non-contact measurement of sheet resistance and shunt resistance of p-n junctions | Ian Sierra Gabriel Kelly-Morgan | 2018-03-20 |
| 9880200 | Method and apparatus for non-contact measurement of forward voltage, saturation current density, ideality factor and I-V curves in P-N junctions | Ian Sierra Gabriel Kelly-Morgan | 2018-01-30 |
| 9823198 | Method and apparatus for non-contact measurement of internal quantum efficiency in light emitting diode structures | — | 2017-11-21 |
| 9746514 | Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctions | Ian Sierra Gabriel Kelly-Morgan, James A. Real, Biren Salunke, Ralph Nyffenegger | 2017-08-29 |
| 7804294 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Phuc Van | 2010-09-28 |
| 7741833 | Non contact method and apparatus for measurement of sheet resistance of p-n junctions | Phuc Van | 2010-06-22 |
| 7737681 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Phuc Van | 2010-06-15 |
| 7737680 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Phuc Van | 2010-06-15 |
| 7642772 | Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers | Michael I. Current, Timothy Wong | 2010-01-05 |
| 7414409 | Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers | Michael I. Current, Timothy Wong | 2008-08-19 |
| 7362088 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Phuc Van | 2008-04-22 |
| 7034563 | Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self aligning electrodes | Vitali Souchkov, Victor Huang, Eugene Fukshansky, Alexander Artjomov, Anatoli Skljarnov | 2006-04-25 |
| 7019513 | Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions | Phuc Van, Michael I. Current, Timothy Wong | 2006-03-28 |
| 6512384 | Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages | Jacek Lagowski, Andrei Aleinikov | 2003-01-28 |