Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7034563 | Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self aligning electrodes | Vitali Souchkov, Vladimir N. Faifer, Victor Huang, Eugene Fukshansky, Anatoli Skljarnov | 2006-04-25 |