EF

Eugene Fukshansky

Applied Materials: 2 patents #3,641 of 7,310Top 50%
Overall (All Time): #1,592,732 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7034563 Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self aligning electrodes Vitali Souchkov, Vladimir N. Faifer, Victor Huang, Alexander Artjomov, Anatoli Skljarnov 2006-04-25
6019848 Lid assembly for high temperature processing chamber Jonathan Frankel, Inna Shmurun, Visweswaren Sivaramakrishnan 2000-02-01
6012600 Pressure responsive clamp for a processing chamber Thanh Pham, David Wanamaker 2000-01-11