Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12176326 | Method of forming semiconductor device using high stress cleave plane | Theodore E. FONG | 2024-12-24 |
| 11901351 | Three dimensional integrated circuit with lateral connection layer | Theodore E. FONG | 2024-02-13 |
| 11626392 | Method of forming semiconductor device using range compensating material | Theodore E. FONG | 2023-04-11 |
| 11410984 | Three dimensional integrated circuit with lateral connection layer | Theodore E. FONG | 2022-08-09 |
| 10923459 | Three dimensional integrated circuit | Theodore E. FONG | 2021-02-16 |
| 10923359 | Limited dose and angle directed beam assisted ALE and ALD processes for localized coatings on non-planar surfaces | Thomas E. Seidel | 2021-02-16 |
| 10896823 | Limited dose atomic layer processes for localizing coatings on non-planar surfaces | Thomas E. Seidel | 2021-01-19 |
| 10804252 | Three dimensional integrated circuit | Theodore E. FONG | 2020-10-13 |
| 10573627 | Three dimensional integrated circuit | Theodore E. FONG | 2020-02-25 |
| 10049915 | Three dimensional integrated circuit | Theodore E. FONG | 2018-08-14 |
| 9704835 | Three dimensional integrated circuit | Theodore E. FONG | 2017-07-11 |
| 8187377 | Non-contact etch annealing of strained layers | Igor J. Malik, Sien G. Kang, Martin Fuerfanger, Harry Kirk, Ariel Flat +1 more | 2012-05-29 |
| D645768 | Junction photovoltage probe face | Yuen Lim | 2011-09-27 |
| 7642772 | Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers | Vladimir N. Faifer, Timothy Wong | 2010-01-05 |
| 7414409 | Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers | Vladimir N. Faifer, Timothy Wong | 2008-08-19 |
| 7019513 | Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions | Vladimir N. Faifer, Phuc Van, Timothy Wong | 2006-03-28 |
| 5155369 | Multiple angle implants for shallow implant | — | 1992-10-13 |
| 5047648 | Method and apparatus for detecting particles in ion implantation machines | Boris Fishkin | 1991-09-10 |