Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7804294 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Vladimir N. Faifer | 2010-09-28 |
| 7741833 | Non contact method and apparatus for measurement of sheet resistance of p-n junctions | Vladimir N. Faifer | 2010-06-22 |
| 7737680 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Vladimir N. Faifer | 2010-06-15 |
| 7737681 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Vladimir N. Faifer | 2010-06-15 |
| 7502121 | Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials | Wojciech Jan Walecki | 2009-03-10 |
| 7362088 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions | Vladimir N. Faifer | 2008-04-22 |
| 7116429 | Determining thickness of slabs of materials by inventors | Wojciech Jan Walecki | 2006-10-03 |
| 7019513 | Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions | Vladimir N. Faifer, Michael I. Current, Timothy Wong | 2006-03-28 |
| 6922067 | Determination of minority carrier diffusion length in solid state materials | Alexander Pravdivtsev | 2005-07-26 |
| 6643393 | Method and apparatus for adhesion testing of thin film materials | Yuen Lim | 2003-11-04 |
| 6611616 | Method and apparatus for adhesion testing of thin film materials | Yuen Lim | 2003-08-26 |
| 6567541 | Method and apparatus for adhesion testing of thin film materials | Yuen Lim | 2003-05-20 |
| 6546820 | Method and apparatus for multifunction vacuum/nonvacuum annealing system | Yuen Lim | 2003-04-15 |
| D450000 | Multiple environment testing chamber | — | 2001-11-06 |