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USPTO Patent Rankings Data through Dec 31, 2025
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Phuc Van — 14 Patents

ALAhbee1, Lp: 6 patents #1 of 8Top 15%
UNUnknown: 2 patents #12,644 of 83,584Top 20%
San Jose, CA: #4,673 of 32,062 inventorsTop 15%
California: #43,920 of 386,348 inventorsTop 15%
Overall (All Time): #332,869 of 4,157,543Top 9%
14 Patents All Time
Phuc Van has been granted 14 US patents while listed as an inventor at Ahbee1, Lp. The first was granted in 2001 and the most recent in September 2010. Phuc Van ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Phuc Van in San Jose, CA, US.

Patents per Year

Patents granted per year, 2001 to 2010Bar chart with a peak of 4 patents in 2003.peak 42001: 1 patents20012003: 4 patents20032005: 1 patents20052006: 2 patents20062008: 1 patents20082009: 1 patents20092010: 4 patents2010

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
7804294 Non contact method and apparatus for measurement of sheet resistance of P-N junctions Vladimir N. Faifer 2010-09-28
7741833 Non contact method and apparatus for measurement of sheet resistance of p-n junctions Vladimir N. Faifer 2010-06-22
7737680 Non contact method and apparatus for measurement of sheet resistance of P-N junctions Vladimir N. Faifer 2010-06-15
7737681 Non contact method and apparatus for measurement of sheet resistance of P-N junctions Vladimir N. Faifer 2010-06-15
7502121 Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials Wojciech Jan Walecki 2009-03-10
7362088 Non contact method and apparatus for measurement of sheet resistance of P-N junctions Vladimir N. Faifer 2008-04-22
7116429 Determining thickness of slabs of materials by inventors Wojciech Jan Walecki 2006-10-03
7019513 Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions Vladimir N. Faifer, Michael I. Current, Timothy Wong 2006-03-28
6922067 Determination of minority carrier diffusion length in solid state materials Alexander Pravdivtsev 2005-07-26
6643393 Method and apparatus for adhesion testing of thin film materials Yuen Lim 2003-11-04
6611616 Method and apparatus for adhesion testing of thin film materials Yuen Lim 2003-08-26
6567541 Method and apparatus for adhesion testing of thin film materials Yuen Lim 2003-05-20
6546820 Method and apparatus for multifunction vacuum/nonvacuum annealing system Yuen Lim 2003-04-15
D450000 Multiple environment testing chamber — 2001-11-06

Frequent Collaborators

Vladimir N. Faifer6 shared
Yuen Lim4 shared
Wojciech Jan Walecki2 shared
Michael I. Current1 shared
Alexander Pravdivtsev1 shared
Timothy Wong1 shared

Nearby-Ranked Inventors

Ke PAN14
Naor Radami14
Jason Harris14
Gwangjae Jeon14
Masao Zen14
Yoshihiro YAMASAKI14
Sanjay Vakil14
Samuel Bartlett14
Taketoshi Okuno14