Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11885609 | Wafer thickness, topography, and layer thickness metrology system | — | 2024-01-30 |
| 11226190 | Measurement of thickness and topography of a slab of materials | — | 2022-01-18 |
| 11163144 | Focusing of optical devices | Mihail Mihaylov, Jae-myung Ryu | 2021-11-02 |
| 11112234 | Multi-probe gauge for slab characterization | — | 2021-09-07 |
| 11105611 | Non-contact measurement of a stress in a film on substrate | Wei-Chun Hung, Raphael Morency | 2021-08-31 |
| 11073372 | Multi-probe gauge for slab characterization | — | 2021-07-27 |
| 10964730 | Non-contact measurement of a stress in a film on a substrate | Oanh Nguyen | 2021-03-30 |
| 10935777 | Focusing of optical devices | Mihail Mihaylov, Jae-myung Ryu | 2021-03-02 |
| 10890434 | Inspecting a multilayer sample | — | 2021-01-12 |
| 10655949 | Inspecting a multilayer sample | Alexander Pravdivtsev | 2020-05-19 |
| 10621739 | Characterization of specular surfaces | Wei-Chun Hung | 2020-04-14 |
| 10584958 | Error reduction in measurement of samples of materials | — | 2020-03-10 |
| 10563975 | Dual-sensor arrangment for inspecting slab of material | — | 2020-02-18 |
| 10553623 | Non-contact measurement of a stress in a film on a substrate | Oanh Nguyen | 2020-02-04 |
| 10551163 | Multi-probe gauge for slab characterization | — | 2020-02-04 |
| 10533841 | Measurement of surface topography of a work-piece | — | 2020-01-14 |
| 10480925 | Inspecting a slab of material | — | 2019-11-19 |
| 10416430 | Focusing of optical devices | Mihail Mihaylov, Jae-myung Ryu | 2019-09-17 |
| 10209058 | Multi-probe gauge for slab characterization | — | 2019-02-19 |
| 10203198 | Measurement of surface topography of a work-piece | — | 2019-02-12 |
| 10168138 | Inspecting a slab of material | Alexander Pravdivtsev | 2019-01-01 |
| 10113860 | Inspecting a multilayer sample | Alexander Pravdivtsev | 2018-10-30 |
| 10036624 | Inspecting a slab of material | Alexander Pravdivtsev | 2018-07-31 |
| 9915564 | Inspecting a slab of material | Alexander Pravdivtsev | 2018-03-13 |
| 7502121 | Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials | Phuc Van | 2009-03-10 |