Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Kwangeun Kim, Seungbum Hong, Sungyoon Ryu, Hoon Kim, Jiwon Yeom +3 more | 2025-08-12 |
| 12362138 | Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same | Jaehyung Ahn, Kwangeun Kim, Younghoon Sohn | 2025-07-15 |
| 12110938 | Vibration isolation table for semiconductor equipment and vibration isolation table system including the same | Hyunchul Kim, Younghoon Sohn | 2024-10-08 |
| 12092656 | Test apparatus and test method thereof | Sungyoon Ryu, Seungbum Hong, Kwangeun Kim, Hoon Kim, Jiwon Yeom +3 more | 2024-09-17 |
| 11181831 | Methods of manufacturing semiconductor device | Kyoung Hwan Lee, Young Ho Kwon, Young-Hoon Sohn, Yu-Sin Yang | 2021-11-23 |
| 11017525 | Semiconductor pattern detecting apparatus | Jae Hyung AHN, Joon-Seo Song, Young-Hoon Sohn, Yu-Sin Yang | 2021-05-25 |
| 11004712 | Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same | Sung Yoon Ryu, Joonseo Song, Younghoon Sohn, Yusin Yang, Chihoon Lee | 2021-05-11 |
| 10410937 | Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement | Jang-Ik Park, Bong Seok Kim, Yu-Sin Yang, Soo Seok Lee | 2019-09-10 |
| 10373796 | Method of inspecting wafer using electron beam | Chung-Sam Jun, Woo-Seok Ko, Sang-Kil Lee, Kwang Il Shin, Yu-Sin Yang +1 more | 2019-08-06 |
| 9583402 | Method of manufacturing a semiconductor device using semiconductor measurement system | Sung Yoon Ryu, Wooseok Ko, Yusin Yang, Sangkil Lee, Chungsam Jun +1 more | 2017-02-28 |
| 9417055 | Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film | Sung Yoon Ryu, Sang-Kil Lee, Chung-Sam Jun, Woo-Seok Ko, Ho-Jeong Kwak +2 more | 2016-08-16 |
| 9148549 | Image processing method and image processing apparatus using time axis low band pass filter | Chang Kue Lim, Chang-yong Um, Hyung-Bae Park | 2015-09-29 |