Souk Kim — 12 Patents at Samsung

Souk Kim has been granted 12 US patents while listed as an inventor at Samsung. The first was granted in 2015 and the most recent in August 2025. Souk Kim ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Souk Kim in Seoul, KR.

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Showing 1–12 of 12 patents

Patent #	Title	Co-Inventors	Date
12385946	Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device	Kwangeun Kim, Seungbum Hong, Sungyoon Ryu, Hoon Kim, Jiwon Yeom +3 more	2025-08-12
12362138	Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same	Jaehyung Ahn, Kwangeun Kim, Younghoon Sohn	2025-07-15
12110938	Vibration isolation table for semiconductor equipment and vibration isolation table system including the same	Hyunchul Kim, Younghoon Sohn	2024-10-08
12092656	Test apparatus and test method thereof	Sungyoon Ryu, Seungbum Hong, Kwangeun Kim, Hoon Kim, Jiwon Yeom +3 more	2024-09-17
11181831	Methods of manufacturing semiconductor device	Kyoung Hwan Lee, Young Ho Kwon, Young-Hoon Sohn, Yu-Sin Yang	2021-11-23
11017525	Semiconductor pattern detecting apparatus	Jae Hyung AHN, Joon-Seo Song, Young-Hoon Sohn, Yu-Sin Yang	2021-05-25
11004712	Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same	Sung Yoon Ryu, Joonseo Song, Younghoon Sohn, Yusin Yang, Chihoon Lee	2021-05-11
10410937	Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement	Jang-Ik Park, Bong Seok Kim, Yu-Sin Yang, Soo Seok Lee	2019-09-10
10373796	Method of inspecting wafer using electron beam	Chung-Sam Jun, Woo-Seok Ko, Sang-Kil Lee, Kwang Il Shin, Yu-Sin Yang +1 more	2019-08-06
9583402	Method of manufacturing a semiconductor device using semiconductor measurement system	Sung Yoon Ryu, Wooseok Ko, Yusin Yang, Sangkil Lee, Chungsam Jun +1 more	2017-02-28
9417055	Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film	Sung Yoon Ryu, Sang-Kil Lee, Chung-Sam Jun, Woo-Seok Ko, Ho-Jeong Kwak +2 more	2016-08-16
9148549	Image processing method and image processing apparatus using time axis low band pass filter	Chang Kue Lim, Chang-yong Um, Hyung-Bae Park	2015-09-29

Souk Kim — 12 Patents

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