Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10410937 | Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement | Jang-Ik Park, Bong Seok Kim, Souk Kim, Yu-Sin Yang | 2019-09-10 |
| 10068324 | 3D profiling system of semiconductor chip and method for operating the same | Jung Soo Kim, Jin Kwan Kim, Chung-Sam Jun, Yu-Sin Yang | 2018-09-04 |