Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Kwangeun Kim, Seungbum Hong, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more | 2025-08-12 |
| 12092656 | Test apparatus and test method thereof | Seungbum Hong, Kwangeun Kim, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more | 2024-09-17 |
| 11988495 | Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation | Kwangsoo Kim, Daejun Park, Seong Jin YUN, Seungryeol Oh, Sujin Lee +4 more | 2024-05-21 |
| 11921270 | Inspection system including reference specimen and method of forming semiconductor device | Sungil Choi, Yeeun Park, Kyungbeom Kim, Jinwoo Ahn, Sunhong Jun | 2024-03-05 |
| 11428645 | Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection device | Kihak Nam, Kwangeun Kim, Hwiwoo Park, Dayoung Yoon, Myoungkyu Choi | 2022-08-30 |
| 8237925 | Prism for inducing Brewster's angle transmission and fluorescence detection apparatus for improving signal-to noise ratio using thereof | Youngjoo Hong, Jeongho Ahn, Hyojun Park, Hyungchul LEE, Wonsik Kwon +1 more | 2012-08-07 |