Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
SR

Sungyoon Ryu — 7 Patents

Samsung: 6 patents #20,081 of 75,807Top 30%
KAIST: 2 patents #4,169 of 11,619Top 40%
ATAdvanced Technology: 1 patents #5 of 25Top 20%
Seoul, KR: #8,201 of 39,741 inventorsTop 25%
Overall (All Time): #680,018 of 4,157,543Top 20%
7 Patents All Time
Sungyoon Ryu has been granted 7 US patents while listed as an inventor at Samsung. The first was granted in 2012 and the most recent in November 2025. Sungyoon Ryu ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Sungyoon Ryu in Seoul, KR.

Patents per Year

Patents granted per year, 2012 to 2025Bar chart with a peak of 3 patents in 2024.peak 32012: 1 patents20122022: 1 patents20222024: 3 patents20242025: 2 patents2025

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
12474260 Terahertz signal measuring apparatus and measuring method Sunhong Jun, Inkeun Baek, Won-Kang Kim, Nam Il Koo, Inseop Kim +4 more 2025-11-18
12385946 Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device Kwangeun Kim, Seungbum Hong, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more 2025-08-12
12092656 Test apparatus and test method thereof Seungbum Hong, Kwangeun Kim, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more 2024-09-17
11988495 Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation Kwangsoo Kim, Daejun Park, Seong Jin YUN, Seungryeol Oh, Sujin Lee +4 more 2024-05-21
11921270 Inspection system including reference specimen and method of forming semiconductor device Sungil Choi, Yeeun Park, Kyungbeom Kim, Jinwoo Ahn, Sunhong Jun 2024-03-05
11428645 Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection device Kihak Nam, Kwangeun Kim, Hwiwoo Park, Dayoung Yoon, Myoungkyu Choi 2022-08-30
8237925 Prism for inducing Brewster's angle transmission and fluorescence detection apparatus for improving signal-to noise ratio using thereof Youngjoo Hong, Jeongho Ahn, Hyojun Park, Hyungchul LEE, Wonsik Kwon +1 more 2012-08-07