Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332164 | Dual resolution spectrometer, and spectrometric measurement apparatus and method using the spectrometer | Jaeho Kim, Younghoon Sohn | 2025-06-17 |
| 11921270 | Inspection system including reference specimen and method of forming semiconductor device | Sungil Choi, Yeeun Park, Kyungbeom Kim, Sungyoon Ryu, Jinwoo Ahn | 2024-03-05 |