Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11921270 | Inspection system including reference specimen and method of forming semiconductor device | Sungil Choi, Kyungbeom Kim, Sungyoon Ryu, Jinwoo Ahn, Sunhong Jun | 2024-03-05 |
YP
Yeeun Park
Overall (All Time): #2,481,960 of 4,157,543Top 60%
1
Patents All Time