Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12089978 | X-ray imaging device | — | 2024-09-17 |
| 11921270 | Inspection system including reference specimen and method of forming semiconductor device | Yeeun Park, Kyungbeom Kim, Sungyoon Ryu, Jinwoo Ahn, Sunhong Jun | 2024-03-05 |
| 11658057 | Wafer chuck | Hyeondong Song, Myeongshik Shim, Jonghyun Hong, Bonggyo SEO | 2023-05-23 |
| 11298092 | X-ray imaging device | — | 2022-04-12 |
| RE47810 | Method and apparatus for obtaining panoramic image | Hyosung Cho, Yangseo Koo | 2020-01-14 |
| 10405815 | X-ray imaging device | — | 2019-09-10 |
| 9117301 | Method and apparatus for obtaining panoramic image | Hyosung Cho, Yangseo Koo | 2015-08-25 |
| 8634515 | Method and apparatus for obtaining panoramic image | Hyosung Cho, Yangseo Koo | 2014-01-21 |