Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Kwangeun Kim, Seungbum Hong, Sungyoon Ryu, Hoon Kim, Jiwon Yeom +3 more | 2025-08-12 |
| 12362138 | Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same | Jaehyung Ahn, Kwangeun Kim, Souk Kim | 2025-07-15 |
| 12332186 | Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the same | Q-Han Park, Sung Yoon Ryu, Seunghyeok Son, Sujin Lee, Chan-Gi Jeon +2 more | 2025-06-17 |
| 12332164 | Dual resolution spectrometer, and spectrometric measurement apparatus and method using the spectrometer | Sunhong Jun, Jaeho Kim | 2025-06-17 |
| 12110938 | Vibration isolation table for semiconductor equipment and vibration isolation table system including the same | Hyunchul Kim, Souk Kim | 2024-10-08 |
| 12092656 | Test apparatus and test method thereof | Sungyoon Ryu, Seungbum Hong, Kwangeun Kim, Hoon Kim, Jiwon Yeom +3 more | 2024-09-17 |
| 11486834 | Substrate inspection method and method of fabricating a semiconductor device using the same | Yusin Yang, Chihoon Lee | 2022-11-01 |
| 11004712 | Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same | Sung Yoon Ryu, Joonseo Song, Souk Kim, Yusin Yang, Chihoon Lee | 2021-05-11 |
| 10720365 | Method of measuring misalignment of chips, a method of fabricating a fan-out panel level package using the same, and a fan-out panel level package fabricated thereby | Yusin Yang | 2020-07-21 |
| 10482593 | Inspection method, inspection system, and method of manufacturing semiconductor package using the same | Yusin Yang | 2019-11-19 |
| 10460436 | Inspection method, inspection system, and method of fabricating semiconductor package using the same | Ilsoo Kim, Yusin Yang | 2019-10-29 |
| 10088297 | Apparatus and method for measuring thickness | Sung Yoon Ryu, Yusin Yang, Chungsam Jun, Yunjung Jee | 2018-10-02 |
| 9892980 | Fan-out panel level package and method of fabricating the same | Jinsung Kim, Yusin Yang, Chungsam Jun | 2018-02-13 |
| 9267903 | Methods and apparatuses for inspecting semiconductor devices using electron beams | Mira Park, Yusin Yang, Sangkil Lee, Yong-Deok Jeong | 2016-02-23 |