Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11004712 | Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same | Sung Yoon Ryu, Souk Kim, Younghoon Sohn, Yusin Yang, Chihoon Lee | 2021-05-11 |
| 10269111 | Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same | Sung Yoon Ryu, Wahseng Yap, Yunjung Jee, Yusin Yang, Chungsam Jun +3 more | 2019-04-23 |