Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269111 | Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same | Joonseo Song, Sung Yoon Ryu, Wahseng Yap, Yusin Yang, Chungsam Jun +3 more | 2019-04-23 |
| 10088297 | Apparatus and method for measuring thickness | Sung Yoon Ryu, Younghoon Sohn, Yusin Yang, Chungsam Jun | 2018-10-02 |