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Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Samsung › Chungsam Jun
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Chungsam Jun — 14 Patents

Samsung: 14 patents #9,821 of 75,807Top 15%
Suwon-si, KR: #2,568 of 18,685 inventorsTop 15%
Overall (All Time): #332,869 of 4,157,543Top 9%
14 Patents All Time
Chungsam Jun has been granted 14 US patents while listed as an inventor at Samsung. The first was granted in 2016 and the most recent in July 2025. Chungsam Jun ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Chungsam Jun in Suwon-si, KR.

Patents per Year

Patents granted per year, 2016 to 2025Bar chart with a peak of 3 patents in 2017.peak 32016: 2 patents20162017: 3 patents20172018: 2 patents20182019: 1 patents20192023: 2 patents20232024: 2 patents20242025: 2 patents2025

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12362139 Semiconductor inspection apparatus and semiconductor inspection method using the same Yujin Cho, Jonghyuk Kang, INHYE PARK, Suyoung Lee, Hongche Noh +1 more 2025-07-15
12352808 Substrate inspection apparatus and substrate inspection method Sekye Jeon, Jinwoo Lee, Jongcheon Sun, Suyoung Lee, Hyeongcheol Lee 2025-07-08
12130242 Inspection system of semiconductor wafer and method of driving the same Doyoung Yoon, Jeongho Ahn, Dongryul Lee, Dongchul Ihm 2024-10-29
11988495 Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation Kwangsoo Kim, Sungyoon Ryu, Daejun Park, Seong Jin YUN, Seungryeol Oh +4 more 2024-05-21
11754510 Inspection system of semiconductor wafer and method of driving the same Doyoung Yoon, Jeongho Ahn, Dongryul Lee, Dongchul Ihm 2023-09-12
11754517 Inspection apparatus for inspecting semiconductor devices using charged particles Suyoung Lee, Jongmin Kim, Ilsuk Park, Kwangil Shin 2023-09-12
10269111 Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same Joonseo Song, Sung Yoon Ryu, Wahseng Yap, Yunjung Jee, Yusin Yang +3 more 2019-04-23
10088297 Apparatus and method for measuring thickness Sung Yoon Ryu, Younghoon Sohn, Yusin Yang, Yunjung Jee 2018-10-02
9892980 Fan-out panel level package and method of fabricating the same Younghoon Sohn, Jinsung Kim, Yusin Yang 2018-02-13
9719946 Ellipsometer and method of inspecting pattern asymmetry using the same Choonshik Leem 2017-08-01
9612212 Ellipsometer and method of inspecting pattern asymmetry using the same Choonshik Leem 2017-04-04
9583402 Method of manufacturing a semiconductor device using semiconductor measurement system Sung Yoon Ryu, Wooseok Ko, Souk Kim, Yusin Yang, Sangkil Lee +1 more 2017-02-28
9466537 Method of inspecting semiconductor device and method of fabricating semiconductor device using the same Minkook KIM, Wooseok Ko, Yusin Yang, Sangkil Lee 2016-10-11
9455121 Semiconductor inspection system and methods of inspecting a semiconductor device using the same Hyunwoo KIM, Wooseok Ko, Minkook KIM, Jung-Hwan Kim, Yusin Yang +1 more 2016-09-27

Frequent Collaborators

Yusin Yang6 shared
Wooseok Ko3 shared
Suyoung Lee3 shared
Sung Yoon Ryu3 shared
Sangkil Lee3 shared
Jeongho Ahn2 shared

Nearby-Ranked Inventors

Ke PAN14
Naor Radami14
Jason Harris14
Gwangjae Jeon14
Masao Zen14
Yoshihiro YAMASAKI14
Sanjay Vakil14
Samuel Bartlett14
Taketoshi Okuno14