Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362139 | Semiconductor inspection apparatus and semiconductor inspection method using the same | Yujin Cho, Jonghyuk Kang, INHYE PARK, Suyoung Lee, Chungsam Jun +1 more | 2025-07-15 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362139 | Semiconductor inspection apparatus and semiconductor inspection method using the same | Yujin Cho, Jonghyuk Kang, INHYE PARK, Suyoung Lee, Chungsam Jun +1 more | 2025-07-15 |