Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362139 | Semiconductor inspection apparatus and semiconductor inspection method using the same | Jonghyuk Kang, INHYE PARK, Suyoung Lee, Chungsam Jun, Hongche Noh +1 more | 2025-07-15 |
YC
Yujin Cho
Overall (All Time): #2,436,683 of 4,157,543Top 60%
1
Patents All Time