Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175655 | Substrate inspection method and device | Doyoung Yoon, Junghoon Kim, Kwangil Shin | 2024-12-24 |
| 11754517 | Inspection apparatus for inspecting semiconductor devices using charged particles | Suyoung Lee, Jongmin Kim, Kwangil Shin, Chungsam Jun | 2023-09-12 |