Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Kwangeun Kim, Seungbum Hong, Sungyoon Ryu, Hoon Kim, Jiwon Yeom +3 more | 2025-08-12 |
| 12092656 | Test apparatus and test method thereof | Sungyoon Ryu, Seungbum Hong, Kwangeun Kim, Hoon Kim, Jiwon Yeom +3 more | 2024-09-17 |
| 11486834 | Substrate inspection method and method of fabricating a semiconductor device using the same | Younghoon Sohn, Chihoon Lee | 2022-11-01 |
| 11004712 | Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same | Sung Yoon Ryu, Joonseo Song, Souk Kim, Younghoon Sohn, Chihoon Lee | 2021-05-11 |
| 10845232 | Mass flow controller, apparatus for manufacturing semiconductor device, and method for maintenance thereof | Sangkil Lee, Sung Yoon Ryu, Q-Han Park, Hyun-Deok Lee | 2020-11-24 |
| 10720365 | Method of measuring misalignment of chips, a method of fabricating a fan-out panel level package using the same, and a fan-out panel level package fabricated thereby | Younghoon Sohn | 2020-07-21 |
| 10482593 | Inspection method, inspection system, and method of manufacturing semiconductor package using the same | Younghoon Sohn | 2019-11-19 |
| 10460436 | Inspection method, inspection system, and method of fabricating semiconductor package using the same | Younghoon Sohn, Ilsoo Kim | 2019-10-29 |
| 10393672 | System and method of inspecting substrate and method of fabricating semiconductor device using the same | Jeongho Ahn, Jae-Man Oh, Seongsil Lee, Dongchul Ihm, Hyungsuk Cho | 2019-08-27 |
| 10269111 | Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same | Joonseo Song, Sung Yoon Ryu, Wahseng Yap, Yunjung Jee, Chungsam Jun +3 more | 2019-04-23 |
| 10088297 | Apparatus and method for measuring thickness | Sung Yoon Ryu, Younghoon Sohn, Chungsam Jun, Yunjung Jee | 2018-10-02 |
| 9892980 | Fan-out panel level package and method of fabricating the same | Younghoon Sohn, Jinsung Kim, Chungsam Jun | 2018-02-13 |
| 9583402 | Method of manufacturing a semiconductor device using semiconductor measurement system | Sung Yoon Ryu, Wooseok Ko, Souk Kim, Sangkil Lee, Chungsam Jun +1 more | 2017-02-28 |
| 9466537 | Method of inspecting semiconductor device and method of fabricating semiconductor device using the same | Minkook KIM, Wooseok Ko, Sangkil Lee, Chungsam Jun | 2016-10-11 |
| 9455121 | Semiconductor inspection system and methods of inspecting a semiconductor device using the same | Hyunwoo KIM, Wooseok Ko, Minkook KIM, Jung-Hwan Kim, Sangkil Lee +1 more | 2016-09-27 |
| 9267903 | Methods and apparatuses for inspecting semiconductor devices using electron beams | Mira Park, Younghoon Sohn, Sangkil Lee, Yong-Deok Jeong | 2016-02-23 |