Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Kwangeun Kim, Seungbum Hong, Sungyoon Ryu, Hoon Kim, Seokjung Yun +3 more | 2025-08-12 |
| 12092656 | Test apparatus and test method thereof | Sungyoon Ryu, Seungbum Hong, Kwangeun Kim, Hoon Kim, Seokjung Yun +3 more | 2024-09-17 |