Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385946 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Seungbum Hong, Sungyoon Ryu, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more | 2025-08-12 |
| 12362138 | Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same | Jaehyung Ahn, Souk Kim, Younghoon Sohn | 2025-07-15 |
| 12092656 | Test apparatus and test method thereof | Sungyoon Ryu, Seungbum Hong, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more | 2024-09-17 |
| 11428645 | Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection device | Kihak Nam, Sungyoon Ryu, Hwiwoo Park, Dayoung Yoon, Myoungkyu Choi | 2022-08-30 |
| 10217897 | Aluminum nitride-aluminum oxide layers for enhancing the efficiency of group III-nitride light-emitting devices | Zhenqiang Ma | 2019-02-26 |