Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12130242 | Inspection system of semiconductor wafer and method of driving the same | Doyoung Yoon, Jeongho Ahn, Dongryul Lee, Chungsam Jun | 2024-10-29 |
| 11754510 | Inspection system of semiconductor wafer and method of driving the same | Doyoung Yoon, Jeongho Ahn, Dongryul Lee, Chungsam Jun | 2023-09-12 |
| 10393672 | System and method of inspecting substrate and method of fabricating semiconductor device using the same | Jeongho Ahn, Jae-Man Oh, Seongsil Lee, Yusin Yang, Hyungsuk Cho | 2019-08-27 |