Test apparatus and test method thereof

Assignee

• Samsung

Inventors

• Sungyoon Ryu (7 patents)
• Seungbum Hong (8 patents)
• Kwangeun Kim (5 patents)
• Hoon Kim (195 patents)
• Jiwon Yeom (2 patents)
• Seokjung Yun (9 patents)
• Souk Kim (12 patents)
• Younghoon Sohn (14 patents)
• Yusin Yang (17 patents)

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