Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11017525 | Semiconductor pattern detecting apparatus | Jae Hyung AHN, Souk Kim, Young-Hoon Sohn, Yu-Sin Yang | 2021-05-25 |
| 10593032 | Defect inspection method and defect inspection apparatus | Sung Yoon Ryu, Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee | 2020-03-17 |
| 9678020 | Apparatus and method for inspection of substrate defect | Woo-Seok Ko, Ji-Young Shin, Seong Jin YUN, Yu-Sin Yang, Sang-Kil Lee +1 more | 2017-06-13 |