Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11181831 | Methods of manufacturing semiconductor device | Kyoung Hwan Lee, Young Ho Kwon, Souk Kim, Yu-Sin Yang | 2021-11-23 |
| 11017525 | Semiconductor pattern detecting apparatus | Jae Hyung AHN, Souk Kim, Joon-Seo Song, Yu-Sin Yang | 2021-05-25 |
| 10989520 | Methods for nondestructive measurements of thickness of underlying layers | Duck Mahn Oh, Jong-An Kim, Si-hyeon Choi, Yu-Sin Yang, Chi Hoon Lee | 2021-04-27 |
| 10969428 | Method of inspecting pattern defect | Chung-Sam Jun, Yu-Sin Yang | 2021-04-06 |
| 10852259 | Apparatus for X-ray inspection, and a method for manufacturing a semiconductor device using the same | Kyoung Hwan Lee, Sang Min Kim, Yu-Sin Yang, Chi Hoon Lee | 2020-12-01 |
| 10585115 | Scanning probe inspector | Duck Mahn Oh, Sung Yoon Ryu, Chung-Sam Jun, Yun-Jung Jee | 2020-03-10 |
| 10527556 | Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same | Min Ho Rim, Jung Soo Kim, Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee | 2020-01-07 |
| 10001444 | Surface inspecting method | Kang-Woong Ko, Sung Yoon Ryu, Gil-woo Song, Tae-Heung Ahn, Hyoung-Jo Jeon +6 more | 2018-06-19 |
| 9036895 | Method of inspecting wafer | Yu-Sin Yang, Sang-Kil Lee | 2015-05-19 |
| 8902412 | Defect inspection apparatus and defect inspection method using the same | Yu-Sin Yang, Sang-Kil Lee | 2014-12-02 |
| 8759763 | Method and apparatus to measure step height of device using scanning electron microscope | Jin Woo Lee, Yong-Deok Jeong, Yu-Sin Yang, Sang-Kil Lee, Chung-Sam Jun | 2014-06-24 |
| 8703405 | Methods of generating three-dimensional process window qualification | Sang-Kil Lee, Yu-Sin Yang | 2014-04-22 |
| 8093804 | Organic electroluminescent display device having a novel concept for luminous efficiency | Hyun Ho Lee | 2012-01-10 |
| 7994813 | Semiconductor device capable of testing a transmission line for an impedance calibration code | Kwang-Il Park, Yong-Gwon Jeong, Si-Hong Kim | 2011-08-09 |