Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11029256 | Apparatus for measuring wafer | Racine Elysia Auxter Nassau, Su Hwan Park, Ki Wan Seo, Nam Il Koo, In Keun Baek +2 more | 2021-06-08 |
| 10733719 | Wafer inspection apparatus and wafer inspection method using the same | Soo Ryonng Kim, Tae-Joong Kim, Jun Bum Park, Byeong Hwan Jeon, Jae Chol Joo | 2020-08-04 |
| 10473579 | Apparatus for inspecting material property of plurality of measurement objects | Young-Duk Kim, Sang Gil Park, Jun Bum Park, Yoichiro Iwa, Byeong Hwan Jeon | 2019-11-12 |
| 10001444 | Surface inspecting method | Kang-Woong Ko, Sung Yoon Ryu, Young-Hoon Sohn, Gil-woo Song, Hyoung-Jo Jeon +6 more | 2018-06-19 |