Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10733719 | Wafer inspection apparatus and wafer inspection method using the same | Tae-Heung Ahn, Tae-Joong Kim, Jun Bum Park, Byeong Hwan Jeon, Jae Chol Joo | 2020-08-04 |
SK
Soo Ryonng Kim
Overall (All Time): #2,807,143 of 4,157,543Top 70%
1
Patents All Time