BJ

Byeong Hwan Jeon

Samsung: 23 patents #5,651 of 75,807Top 8%
HC Hyundai Mobis Co.: 6 patents #155 of 1,496Top 15%
CI Cheil Industries: 2 patents #451 of 975Top 50%
Overall (All Time): #117,555 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #TitleCo-InventorsDate
11805407 Apparatus and method for securely updating binary data in vehicle 2023-10-31
11685402 Autonomous driving apparatus and method Hyuk Lee, Soon Jong Jin, Jun Han Lee 2023-06-27
11654939 Autonomous driving apparatus and method that outputs different warnings based on driving risk Jun Han Lee, Hyuk Lee, Soon Jong Jin 2023-05-23
11615956 Light generator including debris shielding assembly, photolithographic apparatus including the light generator 2023-03-28
11560178 Apparatus and method for displaying rear image of vehicle 2023-01-24
11479267 Autonomous driving apparatus and method Hyuk Lee, Soon Jong Jin, Jun Han Lee 2022-10-25
11420653 Autonomous driving apparatus and method Hyuk Lee, Jun Han Lee, Soon Jong Jin 2022-08-23
11114298 Light generator including debris shielding assembly, photolithographic apparatus including the light generator, and method of manufacturing integrated circuit device using the photolithographic apparatus 2021-09-07
10890527 EUV mask inspection apparatus and method, and EUV mask manufacturing method including EUV mask inspection method 2021-01-12
10779388 EUV generation device 2020-09-15
10733719 Wafer inspection apparatus and wafer inspection method using the same Tae-Heung Ahn, Soo Ryonng Kim, Tae-Joong Kim, Jun Bum Park, Jae Chol Joo 2020-08-04
10473579 Apparatus for inspecting material property of plurality of measurement objects Tae-Heung Ahn, Young-Duk Kim, Sang Gil Park, Jun Bum Park, Yoichiro Iwa 2019-11-12
10431505 Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface Jun Bum Park, Kyung-Sik Kang, Jae Chol Joo, Tae-Joong Kim 2019-10-01
10338370 Clock signal generators and substrate inspecting apparatuses having the same Jun Bum Park, Kyung-Sik Kang, Tae-Joong Kim, Sang Ok Seok 2019-07-02
10001444 Surface inspecting method Kang-Woong Ko, Sung Yoon Ryu, Young-Hoon Sohn, Gil-woo Song, Tae-Heung Ahn +6 more 2018-06-19
9983144 Plasma light source and inspection apparatus including the same Kohei Hashimoto, Nobuyuki Kimura, Wook Kim 2018-05-29
9903705 Apparatus for focus control and method for manufacturing semiconductor device Kwang Soo Kim, Harutaka Sekiya, Kwang-Jun Yoon, Sung Won Park, Young-Duk Kim +1 more 2018-02-27
9897552 Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement system Tae-Joong Kim, Yong-Deok Jeong, Kwang Soo Kim, Yu-Sin Yang, Sang-Kil Lee +1 more 2018-02-20
9839110 Plasma light source apparatus and light source system including the same Wook Kim, Won-Don Joo, Sung Hwi CHO, Young Kyu Park, Jung Chul Lee +1 more 2017-12-05
9746430 Optical inspecting apparatus Tae-Joong Kim, Young Kyu Park, Ki-Jung Son, Chang-Hoon Choi 2017-08-29
9702826 Method of inspecting a surface of an object and optical system for performing the same Kohei Hashimoto, Wook Kim, Chang-Hoon Choi 2017-07-11
9546772 Rod lens for lighting apparatus, lighting apparatus including the same and semiconductor manufacturing method using the apparatus Kwang Soo Kim, Wook Kim, Tae-Joong Kim 2017-01-17
9425036 Light source device and semiconductor manufacturing apparatus including the same Wook Kim, Hashimoto Kohei, Won-Don Joo, Kwang Soo Kim, Sue-Jin Cho 2016-08-23
9374883 Plasma light source apparatus and plasma light generating method Young Kyu Park, Wook Kim, Hashimoto Kohei 2016-06-21
9305764 Plasma light source, inspection apparatus including plasma light source, and method of generating plasma light Young Kyu Park, Wook Kim, Kwang Soo Kim, Tae-Joong Kim 2016-04-05