Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10733719 | Wafer inspection apparatus and wafer inspection method using the same | Tae-Heung Ahn, Soo Ryonng Kim, Tae-Joong Kim, Jun Bum Park, Byeong Hwan Jeon | 2020-08-04 |
| 10431505 | Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface | Jun Bum Park, Kyung-Sik Kang, Byeong Hwan Jeon, Tae-Joong Kim | 2019-10-01 |