Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11043433 | Method of inspecting surface and method of manufacturing semiconductor device | Sung Yoon Ryu, Chung-Sam Jun, Yu-Sin Yang, Yun-Jung Jee | 2021-06-22 |
| 10551326 | Method for measuring semiconductor device | Hyo Hyeong Kang, Kang-Woong Ko, Sung Yoon Ryu, Jae Hyung AHN, Chul Hyung Yoo +4 more | 2020-02-04 |
| 10249544 | Method of inspecting surface and method of manufacturing semiconductor device | Sung Yoon Ryu, Chung-Sam Jun, Yu-Sin Yang, Yun-Jung Jee | 2019-04-02 |
| 10001444 | Surface inspecting method | Kang-Woong Ko, Sung Yoon Ryu, Young-Hoon Sohn, Tae-Heung Ahn, Hyoung-Jo Jeon +6 more | 2018-06-19 |
| 9841688 | Method for detecting overlay error and method for manufacturing semiconductor device using the same | Kang-Woong Ko, Hyoung-Jo Jeon, Masahiro Horie | 2017-12-12 |
| 9267879 | Ellipsometer for detecting surface | Kang-Woong Ko, Hyoung-Jo Jeon | 2016-02-23 |