Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10551326 | Method for measuring semiconductor device | Hyo Hyeong Kang, Kang-Woong Ko, Sung Yoon Ryu, Gil-woo Song, Jae Hyung AHN +4 more | 2020-02-04 |
| 10001444 | Surface inspecting method | Kang-Woong Ko, Sung Yoon Ryu, Young-Hoon Sohn, Gil-woo Song, Tae-Heung Ahn +6 more | 2018-06-19 |
| 9841688 | Method for detecting overlay error and method for manufacturing semiconductor device using the same | Kang-Woong Ko, Masahiro Horie, Gil-woo Song | 2017-12-12 |
| 9267879 | Ellipsometer for detecting surface | Kang-Woong Ko, Gil-woo Song | 2016-02-23 |
| 7538750 | Method of inspecting a flat panel display | Jae Wan Kim, Yong Sik Kim, Hwa-Sub Shim, Heong-min Ahn, Ho Seok Choi +9 more | 2009-05-26 |
| 7193795 | Optical system with image producing surface control unit | Hyeong-min Ahn, Dong Hee Lee, Chang-hyo Kim | 2007-03-20 |
| 7110104 | Panel inspection apparatus | Ho Seok Choi, Yong-Shik Kim, Hyeong-min Ahn | 2006-09-19 |
| 6830376 | Radioactive image apparatus and focus control method thereof | Jae Wan Kim, Jae Hyun Jung, Hyeong Cheol Kim, Jun-Bo Kim, Won Kyu Choi | 2004-12-14 |
| 6501823 | Method of reconstructing a tomogram of an X-ray apparatus | Hyeong Cheol Kim, Won Seok Choi, Jae Hyun Jung, Yong Won Kim, Seung Hwan Choi +4 more | 2002-12-31 |
| 6480002 | Battery inspection system | Jae Hyun Jung, Kwang-Jun Yoon, Hyeong Cheol Kim, Yong Won Kim, Won Seok Choi +1 more | 2002-11-12 |
| 6415014 | Three-dimensional image constructing method using X-ray apparatus | Hyeong Cheol Kim, Jae Hyun Jung, Yong Won Kim, Won Seok Choi, Kwang-Jun Yoon +5 more | 2002-07-02 |